Table of Contents
Essentials of Psychological Assessment Series
Series Editors, Alan S. Kaufman and Nadeen L. Kaufman
Essentials of WAIS-III Assessment
by Alan S. Kaufman and Elizabeth O. Lichtenberger
Essentials of CAS Assessment
by Jack A. Naglieri
Essentials of Forensic Psychological Assessment
by Marc J. Ackerman
Essentials of Bayley Scales of Infant Development-II
Assessment
by Maureen M. Black and Kathleen Matula
Essentials of Myers-Briggs Type Indicator Assessment
by Naomi Quenk
Essentials of WISC-III and WPPSI-R Assessment
by Alan S. Kaufman and Elizabeth O. Lichtenberger
Essentials of Rorschach Assessment
by Tara Rose, Nancy Kaser-Boyd, and Michael P.
Maloney
Essentials of Career Interest Assessment
by Jeffrey P. Prince and Lisa J. Heiser
Essentials of Cross-Battery Assessment
by Dawn P. Flanagan and Samuel O. Ortiz
Essentials of Cognitive Assessment with KAIT and Other
Kaufman Measures
by Elizabeth O. Lichtenberger, Debra Broadbooks,
and Alan S. Kaufman
Essentials of Nonverbal Assessment
by Steve McCallum, Bruce Bracken, and John
Wasserman
Essentials of MMPI-2 Assessment
by David S. Nichols
Essentials of NEPSY Assessment
by Sally L. Kemp, Ursula Kirk, and Marit Korkman
Essentials of Individual Achievement Assessment
by Douglas K. Smith
Essentials of TAT and Other Storytelling Techniques
Assessment
by Hedwig Teglasi
Essentials of WJ III Tests of Achievement Assessment
by Nancy Mather, Barbara J. Wendling, and Richard W.
Woodcock
Essentials of WJ III Cognitive Abilities Assessment
by Fredrick A. Schrank, Dawn P. Flanagan, Richard W.
Woodcock, and Jennifer T. Mascolo
Essentials of WMS-III Assessment
by Elizabeth O. Lichtenberger, Alan S. Kaufman, and
Zona C. Lai
Essentials of MMPI-A Assessment
by Robert P. Archer and Radhika Krishnamurthy
Essentials of Neuropsychological Assessment
by Nancy Hebben and William Milberg
Essentials of Behavioral Assessment
by Michael C. Ramsay, Cecil R. Reynolds,
and R. W. Kamphaus
Essentials of Millon Inventories Assessment, Second Edition
by Stephen N. Strack
Essentials of PAI Assessment
by Leslie C. Morey
Essentials of 16 PF Assessment
by Heather E.-P. Cattell and James M. Schuerger
Essentials of WPPSI -III Assessment
by Elizabeth O. Lichtenberger and Alan S. Kaufman
Essentials of Assessment Report Writing
by Elizabeth O. Lichtenberger, Nancy Mather,
Nadeen L. Kaufman, and Alan S. Kaufman
Essentials of Stanford-Binet Intelligence Scales (SB5)
Assessment
by Gale H. Roid and R. Andrew Barram
Essentials of WISC-IV Assessment
by Dawn P. Flanagan and Alan S. Kaufman
Essentials of KABC-II Assessment
by Alan S. Kaufman, Elizabeth O. Lichtenberger,
Elaine Fletcher-Janzen, and Nadeen L. Kaufman
Essentials of Processing Assessment
by Milton J. Dehn
Essentials of WIAT-II and KTEA-II Assessment
by Elizabeth O. Lichtenberger and Donna R. Smith
Essentials of Assessment with Brief Intelligence Tests
by Susan R. Homack and Cecil R. Reynolds
Essentials of School Neuropsychological Assessment
by Daniel C. Miller
Copyright 2007 by John Wiley & Sons, Inc. All rights reserved.
Published by John Wiley & Sons, Inc., Hoboken, New Jersey.
Published simultaneously in Canada.
Wiley Bicentennial Logo: Richard J. Pacifico
No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, recording, scanning, or otherwise, except as permitted under Sections 107 or 108 of the 1976 United States Copyright Act, without either the prior written permission of the Publisher, or authorization through payment of the appropriate per-copy fee to the Copyright Clearance Center, Inc., 222 Rosewood Drive, Danvers, MA 01923, (978) 750-8400, fax (978) 646-8600, or on the web at www.copyright.com. Requests to the Publisher for permission should be addressed to the Permissions Department, John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030, (201) 748-6011, fax (201) 748-6008 or online at http://www.wiley.com/go/permissions.
Limit of Liability/Disclaimer of Warranty: While the publisher and author have used their best efforts in preparing this book, they make no representations or warranties with respect to the accuracy or completeness of the contents of this book and specifically disclaim any implied warranties of merchantability or fitness for a particular purpose. No warranty may be created or extended by sales representatives or written sales materials. The advice and strategies contained herein may not be suitable for your situation. You should consult with a professional where appropriate. Neither the publisher nor author shall be liable for any loss of profit or any other commercial damages, including but not limited to special, incidental, consequential, or other damages.
This publication is designed to provide accurate and authoritative information in regard to the subject matter covered. It is sold with the understanding that the publisher is not engaged in rendering professional services. If legal, accounting, medical, psychological or any other expert assistance is required, the services of a competent professional person should be sought.
Designations used by companies to distinguish their products are often claimed as trademarks. In all instances where John Wiley & Sons, Inc. is aware of a claim, the product names appear in initial capital or all capital letters. Readers, however, should contact the appropriate companies for more complete information regarding trademarks and registration.
For general information on our other products and services please contact our Customer Care Department within the United States at (800) 762-2974, outside the United States at (317 ) 572-3993 or fax (317) 572-4002.
Wiley also publishes its books in a variety of electronic formats. Some content that appears in print may not be available in electronic books. For more information about Wiley products, visit our website at www.wiley.com.
Library of Congress Cataloging-in-Publication Data:
Flanagan, Dawn P.
Essentials of cross-battery assessment with CD / Dawn P. Flanagan, Samuel O. Ortiz, Vincent C. Alfonso.2nd ed. p. cm.(Essentials of psychological assessment series)
ISBN-13: 978-0-471-75771-9 (paper/CD-ROM ) ISBN-10: 0-471-75771-3 (paper/CD-ROM)
1. Intelligence tests. 2. Intellect. I. Ortiz, Samuel O., 1958- II. Alfonso, Vincent C. III. Title. BF431.F437 2007 153.93dc22
2006036652
Printed in the United States of America.
10 9 8 7 6 5 4 3 2 1
Dedication
Today we break with the tradition of dedicating our books to our children and families. Our children represent the future and we, of course, hope that our work and efforts somehow will result in better lives for them. This time, however, we turn our thoughts to the past where, instead of our children or even our parents, we seek to honor those who have had a profound influence on what we do and the paths we have chosen. In this case, we are referring to the three gentlemen and scientists whose very names are carrying intelligence theory and cognitive science into the next millennium and who put the CHC in CHC theory. We mean, of course, Dr. Raymond Cattell (1905- 1998), Dr. John Horn (1928-2006), and Dr. John Carroll (1916-2003).