Jon Duncan Hagar - IoT System Testing: An IoT Journey from Devices to Analytics and the Edge

IoT System Testing Jon Duncan Hagar IoT System Testing An IoT Journey from Devices to Analytics and the Edge Jon Duncan Hagar Hot Sulphur Springs, CO, USA ISBN-13 (pbk): 978-1-4842-8275-5 ISBN-13 (electronic): 978-1-4842-8276-2 https://doi.org/10.1007/978-1-4842-8276-2 Copyright 2022 by Jon Duncan Hagar This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. Trademarked names, logos, and images may appear in this book. Rather than use a trademark symbol with every occurrence of a trademarked name, logo, or image we use the names, logos, and images only in an editorial fashion and to the benefit of the trademark owner, with no intention of infringement of the trademark. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights. While the advice and information in this book are believed to be true and accurate at the date of publication, neither the authors nor the editors nor the publisher can accept any legal responsibility for any errors or omissions that may be made.

The publisher makes no warranty, express or implied, with respect to the material contained herein. Managing Director, Apress Media LLC: Welmoed Spahr Acquisitions Editor: Spandana Chatterjee Development Editor: James Markham Coordinating Editor: Mark Powers Cover designed by eStudioCalamar Cover image by Denny Muller on Unsplash (www.unsplash.com) Distributed to the book trade worldwide by Apress Media, LLC, 1 New York Plaza, New York, NY 10004, U.S.A. Phone 1-800-SPRINGER, fax (201) 348-4505, e-mail orders-ny@springer- sbm.com, or visit www.springeronline.com. Apress Media, LLC is a California LLC and the sole member (owner) is Springer Science + Business Media Finance Inc (SSBM Finance Inc). SSBM Finance Inc is a Delaware corporation. For information on translations, please e-mail booktranslations@springernature.com; for reprint, paperback, or audio rights, please e-mail bookpermissions@springernature.com.

Apress titles may be purchased in bulk for academic, corporate, or promotional use. eBook versions and licenses are also available for most titles. For more information, reference our Print and eBook Bulk Sales web page at http://www.apress.com/ bulk-sales. Any source code or other supplementary material referenced by the author in this book is available to readers on GitHub (https://github.com/apress). For more detailed information, please visit http://www.apress.com/source- code. The Internet of Things, V&V, and Testing..................................... 3 IoT at a Glance........................................................... 3 Understanding Chaos, Security, and Other Product Qualities....................... 5 Why Test IoT Beyond the Device Itself........................................ 5 Agile vs. 5 Agile vs.

Traditional vs. Who Cares About It Development....................... 6 This Books Audience...................................................... 7 How to Use This Book..................................................... 8 Reference Standards, Books, and the Internet: Context Matters................... 8 Summary................................................................ 10 References............................................................... 10 Figure Reference........................................................ 10 IoT Technology in Time and Space........................................... 11 IoT at a Glance........................................................... 11 IoT Market Segments Where Is IoT Now and in the Future?...................... 13 A Sampling of IoT Challenges in Development and Testing........................ 15 IoT Test Team Responses to the Development History of Testing Is Dead........... 18 Examples of How the IoT Devices Can Impact Testers.......................... 19 Summary................................................................ 22 References............................................................... 23 Figure References....................................................... 23 Big Picture Lessons Learned in IoT Project Test Planning........................ 25 High-Level Issues at a Glance............................................... 25 #1: Creating and Releasing Software........................................ 25 #2: Understanding the IoT Lifecycle........................................ 26 #3: Test Tools for IoT.................................................... 26 #4: Avoid Impacts of Rushing in Competition................................. 26 #5: Advanced IoT Device Challenges........................................ 27 #6: Testing in the Complex World of IoT Systems and Systems of Systems.......... 27 Project Test Risks: What Are They for IoT?..................................... 28 Getting Started with IoT Test Plans and Strategy................................. 29 vii viii Contents Introducing IoT Verification, Validation, and Testing Concepts and Standards.................................................. 33 Summary................................................................ 35 References............................................................... 35 Figure Reference........................................................ 35 Factors Driving IoT Testing/V&V Selection and Planning........................ 37 Factor 1: Using Integrity Levels to Drive V&V/Test Planning and Strategy............................................................. 37 Factor 2: Risk-Based DevOps and Product Maturity Testing........................ 40 Risk Analysis Process for Testers........................................... 41 Factor 3: Organizational Ability Impacts on IoT Test Planning..................... 44 Newbie Companies Level 1............................................ 44 Companies with Experience Moving into IoT Level 2......................... 45 Companies with Hardware (Electronics) Experience Level 3................... 45 Companies with Software Experience Level 3............................... 45 Company with Hardware-Software Experience Level 4........................ 46 Companies with Systems, Hardware, and Software Experience Level 5........... 46 Government Organization No Level but a Special Case........................ 46 Experienced Companies with Only Consumer Product History Level 2........... 47 Factor 4: IoT Project Size and Complexity Impacts on Testing...................... 49 Composite Total Scoring Factors (If You Need to Do That)....................... 51 How IoT Projects Should Mix and Match Factors.............................. 52 Combining IoT Factors for Better Test Planning............................... 53 IoT Test/V&V Cost Estimation............................................. 54 Summary................................................................ 55 References............................................................... 56 Figure References....................................................... 56 Beginner Keys for Starting IoT Test Planning.................................. 57 IoT Key 1: Have a Ubiquitous User Interface (UI)................................ 57 IoT Key 2: Learning from Data Analytics...................................... 59 IoT Key 3: Unique and Specialized Hardware Working to Be a System with the Software............................................... 61 IoT Key 4: Level of V&V/Test Need for Good Enough IoT....................... 61 IoT Key 5: Remaining Agile................................................. 62 IoT Key 6: Testing IoT, Systems, and Large/Complex Software (LCS)................ 62 Summary................................................................ 62 References............................................................... 62