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Yipeng Liu (editor) - Tensors for Data Processing: Theory, Methods, and Applications

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Tensors for Data Processing Theory Methods and Applications First edition - photo 1
Tensors for Data Processing
Theory, Methods, and Applications

First edition

Yipeng Liu

School of Information and Communication Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China

Table of Contents List of tables Tables in Chapter 2 Tables in Chapter 4 - photo 2

Table of Contents
List of tables
  1. Tables in Chapter 2
  2. Tables in Chapter 4
  3. Tables in Chapter 5
  4. Tables in Chapter 6
  5. Tables in Chapter 8
  6. Tables in Chapter 9
  7. Tables in Chapter 11
  8. Tables in Chapter 12
  9. Tables in Chapter 13
  10. Tables in Chapter 14
List of figures
  1. Figures in Chapter 1
  2. Figures in Chapter 2
  3. Figures in Chapter 3
  4. Figures in Chapter 4
  5. Figures in Chapter 5
  6. Figures in Chapter 6
  7. Figures in Chapter 7
  8. Figures in Chapter 8
  9. Figures in Chapter 9
  10. Figures in Chapter 10
  11. Figures in Chapter 11
  12. Figures in Chapter 12
  13. Figures in Chapter 13
  14. Figures in Chapter 14
Landmarks
Copyright

Academic Press is an imprint of Elsevier

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Copyright 2022 Elsevier Inc. All rights reserved.

MATLAB is a trademark of The MathWorks, Inc. and is used with permission.

The MathWorks does not warrant the accuracy of the text or exercises in this book.

This book's use or discussion of MATLAB software or related products does not constitute endorsement or sponsorship by The MathWorks of a particular pedagogical approach or particular use of the MATLAB software.

No part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopying, recording, or any information storage and retrieval system, without permission in writing from the publisher. Details on how to seek permission, further information about the Publisher's permissions policies and our arrangements with organizations such as the Copyright Clearance Center and the Copyright Licensing Agency, can be found at our website: www.elsevier.com/permissions.

This book and the individual contributions contained in it are protected under copyright by the Publisher (other than as may be noted herein).

Notices

Knowledge and best practice in this field are constantly changing. As new research and experience broaden our understanding, changes in research methods, professional practices, or medical treatment may become necessary.

Practitioners and researchers must always rely on their own experience and knowledge in evaluating and using any information, methods, compounds, or experiments described herein. In using such information or methods they should be mindful of their own safety and the safety of others, including parties for whom they have a professional responsibility.

To the fullest extent of the law, neither the Publisher nor the authors, contributors, or editors, assume any liability for any injury and/or damage to persons or property as a matter of products liability, negligence or otherwise, or from any use or operation of any methods, products, instructions, or ideas contained in the material herein.

Library of Congress Cataloging-in-Publication Data

A catalog record for this book is available from the Library of Congress

British Library Cataloguing-in-Publication Data

A catalogue record for this book is available from the British Library

ISBN: 978-0-12-824447-0

For information on all Academic Press publications visit our website at https://www.elsevier.com/books-and-journals

Publisher: Mara Conner

Acquisitions Editor: Tim Pitts

Editorial Project Manager: Charlotte Rowley

Production Project Manager: Prem Kumar Kaliamoorthi

Designer: Miles Hitchen

Typeset by VTeX

List of contributors Kim Batselier Delft Center for Systems and Control Delft - photo 3

List of contributors

Kim Batselier Delft Center for Systems and Control, Delft University of Technology, Delft, The Netherlands

Yingyue Bi School of Information and Communication Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China

Jrmie Boulanger CRIStAL, Universit de Lille, Villeneuve d'Ascq, France

Rmy Boyer CRIStAL, Universit de Lille, Villeneuve d'Ascq, France

Cesar F. Caiafa

Instituto Argentino de Radioastronoma CCT La Plata, CONICET / CIC-PBA / UNLP, Villa Elisa, Argentina

RIKEN Center for Advanced Intelligence Project, Tokyo, Japan

Jocelyn Chanussot LJK, CNRS, Grenoble INP, Inria, Universit Grenoble, Alpes, Grenoble, France

Christos Chatzichristos KU Leuven, Department of Electrical Engineering (ESAT), STADIUS Center for Dynamical Systems, Signal Processing and Data Analytics, Leuven, Belgium

Cong Chen Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong

Nadav Cohen School of Computer Science, Hebrew University of Jerusalem, Jerusalem, Israel

Xudong Cui School of Mathematics, Tianjin University, Tianjin, China

Andr L.F. de Almeida Department of Teleinformatics Engineering, Federal University of Fortaleza, Fortaleza, Brazil

Aybke Erol Circuits and Systems, Department of Microelectronics, Delft University of Technology, Delft, The Netherlands

Yiming Fang Department of Computer Science, Columbia University, New York, NY, United States

Grard Favier Laboratoire I3S, Universit Cte d'Azur, CNRS, Sophia Antipolis, France

Borbla Hunyadi Circuits and Systems, Department of Microelectronics, Delft University of Technology, Delft, The Netherlands

Pratik Jawanpuria Microsoft, Hyderabad, India

Tai-Xiang Jiang School of Economic Information Engineering, Southwestern University of Finance and Economics, Chengdu, Sichuan, China

Paris A. Karakasis School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece

Ouafae Karmouda CRIStAL, Universit de Lille, Villeneuve d'Ascq, France

Hiroyuki Kasai Waseda University, Tokyo, Japan

Eleftherios Kofidis Dept. of Statistics and Insurance Science, University of Piraeus, Piraeus, Greece

Christos Kolomvakis School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece

Yoav Levine School of Computer Science, Hebrew University of Jerusalem, Jerusalem, Israel

Zechu Li Department of Computer Science, Columbia University, New York, NY, United States

Athanasios P. Liavas School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece

Zhouchen Lin Key Lab. of Machine Perception, School of EECS, Peking University, Beijing, China

Xiao-Yang Liu

Department of Computer Science and Engineering, Shanghai Jiao Tong University, Shanghai, China

Department of Electrical Engineering, Columbia University, New York, NY, United States

Yipeng Liu School of Information and Communication Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China

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