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Mihail Nedjalkov - Stochastic Approaches to Electron Transport in Micro- and Nanostructures

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Mihail Nedjalkov Stochastic Approaches to Electron Transport in Micro- and Nanostructures

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The book serves as a synergistic link between the development of mathematical models and the emergence of stochastic (Monte Carlo) methods applied for the simulation of current transport in electronic devices. Regarding the models, the historical evolution path, beginning from the classical charge carrier transport models for microelectronics to current quantum-based nanoelectronics, is explicatively followed. Accordingly, the solution methods are elucidated from the early phenomenological single particle algorithms applicable for stationary homogeneous physical conditions up to the complex algorithms required for quantum transport, based on particle generation and annihilation. The book fills the gap between monographs focusing on the development of the theory and the physical aspects of models, their application, and their solution methods and monographs dealing with the purely theoretical approaches for finding stochastic solutions of Fredholm integral equations.

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Book cover of Stochastic Approaches to Electron Transport in Micro- and - photo 1
Book cover of Stochastic Approaches to Electron Transport in Micro- and Nanostructures
Modeling and Simulation in Science, Engineering and Technology
Series Editors
Nicola Bellomo
Department of Mathematical Sciences, Politecnico di Torino, Torino, Italy
Tayfun E. Tezduyar
Department of Mechanical Engineering, Rice University, Houston, TX, USA
Editorial Board
Kazuo Aoki
National Taiwan University, Taipei, Taiwan
Yuri Bazilevs
School of Engineering, Brown University, Providence, RI, USA
Mark Chaplain
School of Mathematics and Statistics, University of St. Andrews, St. Andrews, UK
Pierre Degond
Department of Mathematics, Imperial College London, London, UK
Andreas Deutsch
Center for Information Services and High-Performance Computing, Technische Universitt Dresden, Dresden, Sachsen, Germany
Livio Gibelli
Institute for Multiscale Thermofluids, University of Edinburgh, Edinburgh, UK
Miguel ngel Herrero
Departamento de Matemtica Aplicada, Universidad Complutense de Madrid, Madrid, Spain
Thomas J. R. Hughes
Institute for Computational Engineering and Sciences, The University of Texas at Austin, Austin, TX, USA
Petros Koumoutsakos
Computational Science and Engineering Laboratory, ETH Zrich, Zrich, Switzerland
Andrea Prosperetti
Cullen School of Engineering, University of Houston, Houston, TX, USA
K. R. Rajagopal
Department of Mechanical Engineering, Texas A&M University, College Station, TX, USA
Kenji Takizawa
Department of Modern Mechanical Engineering, Waseda University, Tokyo, Japan
Youshan Tao
Department of Applied Mathematics, Donghua University, Shanghai, China
Harald van Brummelen
Department of Mechanical Engineering, Eindhoven University of Technology, Eindhoven, Noord-Brabant, The Netherlands

More information about this series at http://www.springer.com/series/4960

Mihail Nedjalkov , Ivan Dimov and Siegfried Selberherr
Stochastic Approaches to Electron Transport in Micro- and Nanostructures
1st ed. 2021
Logo of the publisher Mihail Nedjalkov Institute for Microelectronics - photo 2
Logo of the publisher
Mihail Nedjalkov
Institute for Microelectronics, Faculty of Electrical Engineering and Information Technology, Technische Universitt Wien, Wien, Austria
Institute for Information and Communication Technologies, Bulgarian Academy of Sciences, Sofia, Bulgaria
Ivan Dimov
Institute for Information and Communication Technologies, Bulgarian Academy of Sciences, Sofia, Bulgaria
Siegfried Selberherr
Institute for Microelectronics, Faculty of Electrical Engineering and Information Technology, Technische Universitt Wien, Wien, Austria
ISSN 2164-3679 e-ISSN 2164-3725
Modeling and Simulation in Science, Engineering and Technology
ISBN 978-3-030-67916-3 e-ISBN 978-3-030-67917-0
https://doi.org/10.1007/978-3-030-67917-0
Mathematics Subject Classication (2010): 45B05 45D05 37M05 8108 6008 60J85 60J35 65Z05 65C05 65C35 65C40
Springer Nature Switzerland AG 2021
This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed.
The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use.
The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, expressed or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

This book is published under the imprint Birkhuser, http://www.birkhauser-science.com by the registered company Springer Nature Switzerland AG.

The registered company address is: Gewerbestrasse 11, 6330 Cham, Switzerland

Preface

Computational modeling is an important subject of microelectronics, which is the only alternative to expensive experiments for design and characterization of the basic integrated circuit elements, the semiconductor devices. Modeling comprises mathematical, physical, and electrical engineering approaches needed to compute the electrical behavior in these structures. The role of the computational approach is twofold: (1) to derive models describing the current transport processes in a given structure in terms of governing equations, initial and boundary conditions, and relevant physical quantities, and (2) to derive efficient numerical approaches for performing their evaluation. They are considered as the two sides of the problem, since physical comprehension is achieved on the expense of increased numerical complexity. Stochastic approaches are most widely used in the field in particular, because they reduce memory requirements on the expense of longer simulation time and avoid approximation procedures, requiring additional regularity.

The primary motivation of our book is to present the synergistic link between the development of mathematical models of current transport in semiconductor devices and the emergence of stochastic methods for their simulation. The book fills the gap between other monographs, which focus on the development of the theory and the physical aspects of the models [1, 2], their application [3, 4], and the purely theoretical Monte Carlo approaches for solving Fredholm integral equations [5]. Specific details about this book are given in the following.

The golden era of classical microelectronics is characterized by models based on the Boltzmann transport equation. Their physical transparency in terms of particles featured the widespread development of Monte Carlo methods in the field. At the beginning, almost 50 years ago, a variety of phenomenological algorithms, such as the Monte Carlo Single-Particle algorithm for stationary transport in the presence of boundary conditions, the Monte Carlo Ensemble algorithm relevant for transient processes with initial or boundary conditions, and Monte Carlo algorithms for small signal analysis, were derived using the probabilistic interpretation of the processes described. Thus, the stochastic method is viewed as a simulated experiment, which emulates the elementary processes in the electron evolution. The fact that these algorithms solve the transport equation was proved afterward. The inverse perspective, algorithms from the transport model, developed during the last 15 years of the twentieth century, gave rise to a universal approach based on the formal application of the numerical Monte Carlo theory on the integral form of the transport model. This is the Iteration Approach, which allows to unify the existing algorithms as particular cases as well as the derivation of novel algorithms with refined properties. These are the high precision algorithms based on backward evolution in time and algorithms with improved statistics based on event biasing, which stimulates the generation of rare events. As applied to the problem of self-consistent coupling with the Poisson equation, the approach gave rise to self-consistent event biasing and the concept for time-dependent particle weights. An important feature of the Iteration Approach is that the original model can be reformulated within the context of a Monte Carlo analysis in a way that allows for a novel improved model of the underlying physics.

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