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Parreiras - Semantic Web and Model-Driven Engineering

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Parreiras Semantic Web and Model-Driven Engineering
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IEEE Press 445 Hoes Lane Piscataway NJ 08854 IEEE Press Editorial Board - photo 1

IEEE Press

445 Hoes Lane

Piscataway, NJ 08854

IEEE Press Editorial Board

Lajos Hanzo, Editor in Chief

R. AbhariM. El-HawaryO. P. Malik
J. AndersonB-M. HaemmerliS. Nahavandi
G. W. ArnoldM. LanzerottiT. Samad
F. CanaveroD. JacobsonG. Zobrist

Kenneth Moore, Director of IEEE Book and Information Services (BIS)

Copyright 2012 by Institute of Electrical and Electronics Engineers. All rights reserved.

Published by John Wiley & Sons, Inc., Hoboken, New Jersey.

Published simultaneously in Canada.

No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, recording, scanning, or otherwise, except as permitted under Section 107 or 108 of the 1976 United States Copyright Act, without either the prior written permission of the Publisher, or authorization through payment of the appropriate per-copy fee to the Copyright Clearance Center, Inc., 222 Rosewood Drive, Danvers, MA 01923, (978) 750-8400, fax (978) 750-4470, or on the web at www.copyright.com. Requests to the Publisher for permission should be addressed to the Permissions Department, John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030, (201) 748-6011, fax (201) 748-6008, or online at http://www.wiley.com/go/permissions.

Limit of Liability/Disclaimer of Warranty: While the publisher and author have used their best efforts in preparing this book, they make no representations or warranties with respect to the accuracy or completeness of the contents of this book and specifically disclaim any implied warranties of merchantability or fitness for a particular purpose. No warranty may be created or extended by sales representatives or written sales materials. The advice and strategies contained herein may not be suitable for your situation. You should consult with a professional where appropriate. Neither the publisher nor author shall be liable for any loss of profit or any other commercial damages, including but not limited to special, incidental, consequential, or other damages.

For general information on our other products and services or for technical support, please contact our Customer Care Department within the United States at (800) 762-2974, outside the United States at (317) 572-3993 or fax (317) 572-4002.

Wiley also publishes its books in a variety of electronic formats. Some content that appears in print may not be available in electronic formats. For more information about Wiley products, visit our web site at www.wiley.com.

Library of Congress Cataloging-in-Publication Data is available.

ISBN: 978-1-118-00417-3

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LIST OF FIGURES

1.1Context of the Book.
2.1Main Concepts of Megamodel.
2.2Notion of RepresentationOf in Megamodel.
2.3Notion of ConformsTo in Megamodel.
2.4Layered Architecture.
2.5EMOF Classes.
2.6Ecore Structure.
2.7Structure, Semantics, and Syntax of the UML Language.
2.8UML Class Diagram of an E-Shop System.
2.9MOF Technical Space.
3.1Semantic Web Stack Covered in This Chapter.
3.2E-Shop Example with Description Logic Syntax.
3.3Closing the Domain of E-Shop with OWL Axioms.
3.4OWL Class Descriptions of the OMG OWL Metamodel [114].
3.5OWL Properties of the OMG OWL Metamodel [114].
3.6RDFS Properties of the OMG OWL Metamodel [114].
3.7OWL Class Descriptions of the NeOn Metamodel.
3.8OWL Properties of the NeOn Metamodel.
3.9OWL Class Descriptions of the OWL 2 Metamodel.
3.10OWL Properties of the OWL 2 Metamodel.
3.11Snippets of the SWRL Metamodel and the Connections with the OWL Metamodel.
3.12Snippets of the SPARQL Metamodel.
3.13The Description Logics Technical Space.
3.14Relation between the EBNF Technical Space and the Description Logics Technical Space.
3.15Model-Driven Viewpoint of Ontology Technologies.
4.1Marrying MMTS and OTS.
4.2Comparing UML Class Diagrams, OWL-DL, OWL 2, and DL-Lite.
4.3Snippet of the Feature Model of Bridging OTS and MMTS.
4.4Organization of Features According to Technical Space.
4.5Checking Consistency of UML Models.
4.6Feature Model Configuration for Model Checking.
4.7Mapping between Two Models Ma and Mb.
4.8Feature Model Configuration for Model Enrichment.
4.9Ontology Modeling with UML Profile.
4.10Feature Model Configuration for Ontology Modeling.
5.1The TwoUse Conceptual Architecture.
5.2Adapting the OWL Class for UML Class-Based Modeling.
5.3The OWL 2 Metamodel Adapted for the UML Class-Based Metamodel the TwoUse Metamodel.
5.4UML Class Diagram Profiled with UML Profile for OWL and TwoUse Profile.
6.1Existing Approaches for Querying Models.
6.2Variables in the SPARQLAS Metamodel.
6.3Composing the SPARQLAS Metamodel and the TwoUse Metamodel.
6.4Snapshot of the Running Example.
6.5Positioning SPARQLAS4TwoUse among Existing Approaches.
7.1Use Case for a Generic Architecture for MDE and Ontology Engineering.
7.2A Generic Architecture for MDE and Ontology Engineering.
7.3The TwoUse Toolkit.
7.4TwoUse Toolkit Snapshot: Explanation Service.
7.5TwoUse Toolkit Snapshot: View Inferred Class Hierarchy.
7.6Instantiation of the Generic Architecture: The TwoUse Toolkit.
8.1Application of the Strategy Pattern in the Running Example.
8.2Drawbacks of the Strategy Pattern.
8.3Strategy and Abstract Factory Patterns with Configuration Object.
8.4UML Sequence Diagram of Strategy and Abstract Factory Patterns with Configuration Object.
8.5Domain Design by a UML Class Diagram Using a UML Profile for OWL.
8.6Profiled UML Class Diagram of an Ontology-Based Solution.
8.7Profiled UML Class Diagram with the Strategy Pattern.
8.8Sequence Diagram of an OWL-Based Solution.
8.9Structure, Participants, and Collaborations in the Selector Pattern.
9.1UML Class Diagram and Sequence Diagram of KAT Algorithms.
9.2UML Class Diagram of KAT.
9.3Excerpt of a KAT model (M1).
9.4Snapshot of KAT (M0).
10.1Development Life Cycle of the TwoUse Toolkit.
10.2Snippets of Use Case Diagram from TwoUse Toolkit.
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