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Höfflinger - CHIPS 2020. VOL. 2, New vistas in nanoelectronics

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Höfflinger CHIPS 2020. VOL. 2, New vistas in nanoelectronics
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The release of this second volume of CHIPS 2020 coincides with the 50th anniversary of Moores Law, a critical year marked by the end of the nanometer roadmap and by a significantly reduced annual rise in chip performance. At the same time, we are witnessing a data explosion in the Internet, which is consuming 40% more electrical power every year, leading to fears of a major blackout of the Internet by 2020. The messages of the first CHIPS 2020, published in 2012, concerned the realization of quantum steps for improving the energy efficiency of all chip functions. With this second volume, we review these messages and amplify upon the most promising directions: ultra-low-voltage electronics, nanoscale monolithic 3D integration, relevant-data, brain- and human-vision-inspired processing, and energy harvesting for chip autonomy. The team of authors, enlarged by more world leaders in low-power, monolithic 3D, video, and Silicon brains, presents new vistas in nanoelectronics, promising Moore-like exponential growth sustainable through to the 2030s.;News on 8 Chip-Technologies -- Monolithic 3D Integration -- Comprehensive, Reliable, Low-Power Electronics -- Analog for a Digital World -- Interconnects, Communication -- Developments in the Chip Market -- ITRS, The 2014-2029 International Technology Roadmap of Semiconductors -- Nanolithography -- Power-Efficient Design -- Super processors and Super computers -- Memory -- Hybrid 3D Integration for Wireless Multimedia -- Technology for the Next-Generation Mobile User -- MEMS -Micro-Electromechanical Systems -- Vision Chips and Cameras -- Digital Neural Networks -- Retinal Implants -- The Human-Brain Projects -- Energy Harvesting and Chip Autonomy -- 2020 World with Chips.

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Springer International Publishing Switzerland 2016
Bernd Hfflinger (ed.) CHIPS 2020 VOL. 2 The Frontiers Collection 10.1007/978-3-319-22093-2_1
1. News on Eight Chip Technologies
Bernd Hoefflinger 1
(1)
5 Leonberger Strasse, 71063 Sindelfingen, Germany
Bernd Hoefflinger
Email:
Abstract
The eight chip technologies selected for the 2012 perspective on CHIPS 2020 advanced, with the exception of single-electron ICs. Three of them merged into major cooperative R&D: The S3S initiative stands for Silicon-on-Insulator, 3D integration, and Subthreshold MOS, which we treated then and treat again extensively, particularly in differential logic.
1.1 Overview
Bipolar Technology continues, in the Silicon-Germanium symbiosis, to achieve the highest frequencies, approaching 1 Tera(1012)-Hz. PMOS/NMOS Technologies have no individual future but continue in the dominating CMOS technologies .
CMOS-IC Technologies receive by far the largest R&D and equipment investments with over 100 billion $, growing by more than 10 % per year and the threat of diminishing returns at physical transistor lengths below 20 nm. The reason is the fundamental variance of semiconductor transistor properties, analyzed in CHIPS 2020, and now commonly accepted. In order to control this variance at 20 nm and below, two camps are evident, which pursue different kinds of dual-gate transistors: One is the Toblerone-type of transistor, called FINFET or Tri-Gate, which is oriented towards high-transconductance at the price of a large transistor capacitance and footprint. The other is the silicon-on-insulator (SOI) type treated in the following section.
SOI-CMOS IC Technologies are based on the reference nanotransistor in CHIPS 2020. The thin, fully-depleted (FD) transistor channel is formed on a buried oxide, under which any conducting layer has a second-gate, often called buried-gate, effect for specific channel control. This SOTB (silicon-on-thin-buried-oxide) technology allows the highest transistor density, lowest supply voltage V and transistor capacitance C, offering the minimum internal switching energy CV2.
SOTB is the core technology of the strategic, Sustainable-Low-Power Electronics Project described in Chap..
3D CMOS IC Technologies finally receive wider R&D attention because the 2D shrinking of transistors has reached its fundamental (and practical) limits. Monolithic, crystalline, high-density stacking of transistors at the nano-scale with high crystal and transistor quality is presented in Sect. of CHIPS 2020 with selective epitaxy and lateral crystalline overgrowth.
Topography and process complexity now receive rapidly expanding attention, as described in detail in Chap..
Chip Stacks have become rapidly the largest, fast-growing development area besides the continuing development effort on the nanometer roadmap. The stacking of memory chips has advanced faster than our earlier predictions, as well as stacking heterogeneous chips, like processors and memories or MEMS and processors.
Single-Electron ICs with an electron Coulomb-confined in a transistor channel were the research hit at the turn of the millennium. Low operating temperatures and high switching voltages (~10 V) have put this approach off the list. As we have shown in Chap. 1 of CHIPS 2020, our 10 nm FD-SOI reference transistor is statistically a single-electron transistor operating at normal environment temperatures with a practical operating voltage of 200 mV.
Ultra-Low-Voltage Differential CMOS Logic, in its effective implementation as differential transmission-gate (DTG) CMOS logic, is the most promising direction to lower the operating voltage with sufficient noise margin, to minimize the transistor count and energy while maintaining operating speed. Most recently, this direction with a sophisticated history is picking up speed, since a design library for 40 nm CMOS was published in 2012. However, the force and inertia of less efficient standard-cell, static CMOS circuit libraries with energy improvements of ~10 % per generation proves that any more disruptive innovations with order-of-magnitude improvements have to be accompanied by large-scale infrastructure regarding design, test and technology portability, in order to achieve a broad impact.
The emphasis in Chap. 3 of the 2012 CHIPS 2020 on ultra-low voltage, sub-threshold transistor operation has been echoed broadly in applied nanoelectronics. It is at the core of Chap. ).
Fig 11 The life-span of chip technologies 2012 Updates The first - photo 1
Fig. 1.1
The life-span of chip technologies, 2012 []. Updates: The first 3D-CMOS killer product arrived 2013 with vertical-gate flash memory. Single-electron-transistor first product will not arrive before 2020. Low-voltage, differential logic has arrived, but will dominate only closer towards 2020
1.2 Bipolar-Transistor Technology
Bipolar transistors were identified in [] as the transistor type, which continues to offer the highest drive currents, a favorable transconductance and frequency limits of several hundred GHzat additional manufacturing cost, limited area efficiency and limited compatibility for monolithic, high-density integration with mainstream nano-scale CMOS technologies.
However, their Terahertz capabilities are being pushed further as shown in Fig. ]. The figure shows that Silicon-Germanium offers this performance, outperforming the more expensive Indium-Phosphide transistor technology. Cost-effective heterogeneous 3D integration on large-scale CMOS-chips is the much-needed development for the future of bipolar transistors in nanoelectronics.
Fig 12 Output power versus frequency for THz sources 13 CMOS - photo 2
Fig 12 Output power versus frequency for THz sources 13 CMOS - photo 3
Fig. 1.2
Output power versus frequency for THz sources []
1.3 CMOS Integrated Circuits
Circuits on the basis of complementary MOS transistors make up well over 90 % of all ICs. The reduction in transistor size, to achieve higher densities or functionalities, has come to the limits predicted in []. For the key parameter, the length L of the transistor channels:
  • For Logic: 16 nm,
  • FOR DRAM: 24 nm
  • For SRAM: 14 nm
  • For Flash: 16 nm.
The competition between FinFET and SOI , not considering the cost of manufacturing, can be reduced to the necessary switching energy (CTr + CFan-out + CWire)V2.
The transistor capacitance for the FinFET in Fig. is
where k lt 1 accounts for the profile of the fin In the four cross-section - photo 4
where k < 1 accounts for the profile of the fin. In the four cross-section examples, the effective transistor widths (kW + H1 + H2) are about 105, 82, 116 and 56, respectively. This shows that FinFET technologies are drive-current or charge-oriented with large transistor capacitances. The cross-sections shown relate to technologies with about 24 nm minimum features so that the minimum half-pitch of transistor-rows in the direction of current flow would be between 33 and 40 nm.
Fig 13 Schematic cross-sections of a FinFET a fully-depleted FD - photo 5
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