• Complain

Kim Phuc Tran - Control Charts and Machine Learning for Anomaly Detection in Manufacturing

Here you can read online Kim Phuc Tran - Control Charts and Machine Learning for Anomaly Detection in Manufacturing full text of the book (entire story) in english for free. Download pdf and epub, get meaning, cover and reviews about this ebook. year: 2021, publisher: Springer, genre: Romance novel. Description of the work, (preface) as well as reviews are available. Best literature library LitArk.com created for fans of good reading and offers a wide selection of genres:

Romance novel Science fiction Adventure Detective Science History Home and family Prose Art Politics Computer Non-fiction Religion Business Children Humor

Choose a favorite category and find really read worthwhile books. Enjoy immersion in the world of imagination, feel the emotions of the characters or learn something new for yourself, make an fascinating discovery.

Kim Phuc Tran Control Charts and Machine Learning for Anomaly Detection in Manufacturing
  • Book:
    Control Charts and Machine Learning for Anomaly Detection in Manufacturing
  • Author:
  • Publisher:
    Springer
  • Genre:
  • Year:
    2021
  • Rating:
    3 / 5
  • Favourites:
    Add to favourites
  • Your mark:
    • 60
    • 1
    • 2
    • 3
    • 4
    • 5

Control Charts and Machine Learning for Anomaly Detection in Manufacturing: summary, description and annotation

We offer to read an annotation, description, summary or preface (depends on what the author of the book "Control Charts and Machine Learning for Anomaly Detection in Manufacturing" wrote himself). If you haven't found the necessary information about the book — write in the comments, we will try to find it.

This book introduces the latest research on advanced control charts and new machine learning approaches to detect abnormalities in the smart manufacturing process. By approaching anomaly detection using both statistics and machine learning, the book promotes interdisciplinary cooperation between the research communities, to jointly develop new anomaly detection approaches that are more suitable for the 4.0 Industrial Revolution.

The book provides ready-to-use algorithms and parameter sheets, enabling readers to design advanced control charts and machine learning-based approaches for anomaly detection in manufacturing. Case studies are introduced in each chapter to help practitioners easily apply these tools to real-world manufacturing processes.

The book is of interest to researchers, industrial experts, and postgraduate students in the fields of industrial engineering, automation, statistical learning, and manufacturing industries.

Kim Phuc Tran: author's other books


Who wrote Control Charts and Machine Learning for Anomaly Detection in Manufacturing? Find out the surname, the name of the author of the book and a list of all author's works by series.

Control Charts and Machine Learning for Anomaly Detection in Manufacturing — read online for free the complete book (whole text) full work

Below is the text of the book, divided by pages. System saving the place of the last page read, allows you to conveniently read the book "Control Charts and Machine Learning for Anomaly Detection in Manufacturing" online for free, without having to search again every time where you left off. Put a bookmark, and you can go to the page where you finished reading at any time.

Light

Font size:

Reset

Interval:

Bookmark:

Make
Contents
Landmarks
Book cover of Control Charts and Machine Learning for Anomaly Detection in - photo 1
Book cover of Control Charts and Machine Learning for Anomaly Detection in Manufacturing
Springer Series in Reliability Engineering
Series Editor
Hoang Pham
Department of Industrial and Systems Engineering, Rutgers University, Piscataway, NJ, USA

Todays modern systems have become increasingly complex to design and build, while the demand for reliability and cost effective development continues. Reliability is one of the most important attributes in all these systems, including aerospace applications, real-time control, medical applications, defense systems, human decision-making, and home-security products. Growing international competition has increased the need for all designers, managers, practitioners, scientists and engineers to ensure a level of reliability of their product before release at the lowest cost. The interest in reliability has been growing in recent years and this trend will continue during the next decade and beyond.

The Springer Series in Reliability Engineering publishes books, monographs and edited volumes in important areas of current theoretical research development in reliability and in areas that attempt to bridge the gap between theory and application in areas of interest to practitioners in industry, laboratories, business, and government.

**Indexed in Scopus and EI Compendex**

Interested authors should contact the series editor, Hoang Pham, Department of Industrial and Systems Engineering, Rutgers University, Piscataway, NJ 08854, USA. Email:hopham@rci.rutgers.edu, or Anthony Doyle, Executive Editor, Springer, London. Email:anthony.doyle@springer.com.

More information about this series at http://www.springer.com/series/6917

Editor
Kim Phuc Tran
Control Charts and Machine Learning for Anomaly Detection in Manufacturing
1st ed. 2022
Logo of the publisher Editor Kim Phuc Tran ENSAIT GEMTEX University of - photo 2
Logo of the publisher
Editor
Kim Phuc Tran
ENSAIT& GEMTEX, University of Lille, Lille, France
ISSN 1614-7839 e-ISSN 2196-999X
Springer Series in Reliability Engineering
ISBN 978-3-030-83818-8 e-ISBN 978-3-030-83819-5
https://doi.org/10.1007/978-3-030-83819-5
The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerland AG 2022
This work is subject to copyright. All rights are solely and exclusively licensed by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed.
The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use.
The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, expressed or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

This Springer imprint is published by the registered company Springer Nature Switzerland AG

The registered company address is: Gewerbestrasse 11, 6330 Cham, Switzerland

Contents
Kim Phuc Tran
Phuong Hanh Tran , Adel Ahmadi Nadi , Thi Hien Nguyen , Kim Duc Tran and Kim Phuc Tran
Philippe Castagliola , Giovanni Celano , Dorra Rahali and Shu Wu
Maria Anastasopoulou and Athanasios C. Rakitzis
Christian H. Wei
Xiulin Xie and Peihua Qiu
Tommaso Barbariol , Filippo Dalla Chiara , Davide Marcato and Gian Antonio Susto
Anne-Sophie Collin and Christophe De Vleeschouwer
Edgard M. Maboudou-Tchao and Charles W. Harrison
Khanh T. P. Nguyen
The Author(s), under exclusive license to Springer Nature Switzerland AG 2022
K. P. Tran (ed.) Control Charts and Machine Learning for Anomaly Detection in Manufacturing Springer Series in Reliability Engineering https://doi.org/10.1007/978-3-030-83819-5_1
Introduction to Control Charts and Machine Learning for Anomaly Detection in Manufacturing
Kim Phuc Tran
(1)
University of Lille, ENSAIT, GEMTEX, 59000 Lille, France
Kim Phuc Tran
Email:
Abstract

In this chapter, we provide an introduction to Anomaly Detection and potential applications in manufacturing using Control Charts and Machine Learning techniques. We elaborate on the peculiarities of process monitoring and Anomaly Detection with Control Charts and Machine Learning in the manufacturing process and especially in the smart manufacturing contexts. We present the main research directions in this area and summarize the structure and contribution of the book.

Scope of the Research Domain

Anomaly Detection is a set of major techniques with an aim to detect rare events or observations that deviate from normal behavior. Process monitoring and Anomaly Detection are becoming increasingly important to enhance reliability and productivity in manufacturing by detecting abnormalities early. For example, a vibration level in an electric motor exceeding the permissible threshold can be considered as an anomaly, it might not be considered as a fault. However, if the vibration level continues to rise and leads to motor destruction, it can be considered as faulty. Therefore, Anomaly Detection can provide advantages to manufacturing companies by reducing their downtime due to machine breakdowns by detecting a failure before this results in a catastrophic event that may cause degradation of the process and product (Lindemann et al. []). There have been various data-driven and model-based approaches to detect anomalies occurring in manufacturing systems. The most common approach to Anomaly Detection includes Control Charts and Machine Learning methods. In manufacturing, Control Charts are effective tools of Statistical Process Control (SPC) for continuously monitoring a process as well as detecting process abnormalities to improve and optimize the process. There are many different types of Control Charts that have been developed for this purpose. In addition, Machine Learning methods have been used a lot in detecting anomalies with different applications in manufacturing such as, detecting network attacks, detecting abnormal states in machines. Finally, the interference of these two techniques is also found in literature such as the design of Control Charts, anomaly signal interpretation, and pattern recognition in Control Charts using Machine Learning techniques.

In recent years, the rapid development and wide application of advanced technologies have profoundly impacted industrial manufacturing. The recent development of information and communication technologies such as smart sensor networks and the Internet of Things (IoT) has engendered the concept of Smart Manufacturing (SM) that adds intelligence into the manufacturing process to drive continuous improvement, knowledge transfer, and data-based decision-making. In this context, the increasing volume and quality of data from production facilitate the extraction of meaningful information, predicting future states of the manufacturing system that would be impossible to obtain even by human experts. Due to recent advances in the field of SPC, there are a lot of advanced Control Charts that have been developed, thus SPC can become a powerful tool for handling many Big Data applications that are beyond the production line monitoring in the context of SM Qiu [] categorized anomalies in machines, controllers, and networks along with their detection mechanisms, and unify them under a common framework to allows the identification of gaps in Anomaly Detection in SM systems that should be addressed in future studies solutions.

Next page
Light

Font size:

Reset

Interval:

Bookmark:

Make

Similar books «Control Charts and Machine Learning for Anomaly Detection in Manufacturing»

Look at similar books to Control Charts and Machine Learning for Anomaly Detection in Manufacturing. We have selected literature similar in name and meaning in the hope of providing readers with more options to find new, interesting, not yet read works.


Reviews about «Control Charts and Machine Learning for Anomaly Detection in Manufacturing»

Discussion, reviews of the book Control Charts and Machine Learning for Anomaly Detection in Manufacturing and just readers' own opinions. Leave your comments, write what you think about the work, its meaning or the main characters. Specify what exactly you liked and what you didn't like, and why you think so.