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Robert D. Blackledge - Leading Edge Techniques in Forensic Trace Evidence Analysis: More New Trace Analysis Methods

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Leading Edge Techniques in Forensic Trace Evidence Analysis: More New Trace Analysis Methods: summary, description and annotation

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Leading Edge Techniques in Forensic Trace Evidence AnalysisIn-depth exploration of the latest methodologies, tools, and techniques for analyzing trace evidenceIn Leading Edge Techniques in Forensic Trace Evidence Analysis, distinguished and highly qualified contributors cover the significant advances in methodology and instruments that are now being used to analyze trace evidence in forensic laboratories, including new techniques used to determine authenticity of objects and artifacts (such as Combined Raman/LIBS Microscopy) and those used to analyze surface treatments (such as py-GC-PARCI-MS). The work also covers new evidence types, such as surface-modified fibers, microscopic particles, and shimmer, and provides detailed explanations and practical examples of all of the aforementioned topics.Among the topics covered are:Forensic analysis of shimmer particles in cosmetics samples, glitter and other flake pigments, and x-ray photoelectron spectroscopy Surface acoustic wave nebulization mass spectrometry, forensic applications of gas chromatography vacuum ultraviolet, and spectroscopy paired with mass spectrometry Density determination and separation via magneto-Archimedes levitation and elemental imaging of forensic traces with macro and micro XRF Characterization of human head hairs via proteomics and Raman and surface-enriched Raman scattering (SERS) for trace analysisWith detailed explanations of modern methodologies, tools, techniques, and evidence types in trace evidence forensics, along with helpful guidance to put covered concepts into practice,Leading Edge Techniques in Forensic Trace Evidence Analysis serves as an invaluable hands-on reference for scientists in forensic laboratories worldwide.

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Table of Contents List of Tables Chapter 1 Chapter 2 Chapter 3 Chapter - photo 1
Table of Contents
List of Tables
  1. Chapter 1
  2. Chapter 2
  3. Chapter 3
  4. Chapter 4
  5. Chapter 5
  6. Chapter 7
  7. Chapter 9
  8. Chapter 10
List of Illustrations
  1. Chapter 1
  2. Chapter 2
  3. Chapter 3
  4. Chapter 4
  5. Chapter 5
  6. Chapter 6
  7. Chapter 7
  8. Chapter 8
  9. Chapter 9
  10. Chapter 10
Guide
Pages
Leading Edge Techniques in Forensic Trace Evidence Analysis
More New Trace Analysis Methods

Edited by
Robert D. Blackledge

This edition first published 2023 2023 John Wiley Sons Inc All rights - photo 2

This edition first published 2023

2023 John Wiley & Sons, Inc.

All rights reserved. No part of this publication may be reproduced, stored in a retrieval system, or transmitted, in any form or by any means, electronic, mechanical, photocopying, recording or otherwise, except as permitted by law. Advice on how to obtain permission to reuse material from this title is available at http://www.wiley.com/go/permissions.

The right of Robert D. Blackledge to be identified as the author of this work has been asserted in accordance with law.

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For details of our global editorial offices, customer services, and more information about Wiley products visit us at www.wiley.com.

Wiley also publishes its books in a variety of electronic formats and by printondemand. Some content that appears in standard print versions of this book may not be available in other formats.

Limit of Liability/Disclaimer of Warranty

In view of ongoing research, equipment modifications, changes in governmental regulations, and the constant flow of information relating to the use of experimental reagents, equipment, and devices, the reader is urged to review and evaluate the information provided in the package insert or instructions for each chemical, piece of equipment, reagent, or device for, among other things, any changes in the instructions or indication of usage and for added warnings and precautions. While the publisher and authors have used their best efforts in preparing this work, they make no representations or warranties with respect to the accuracy or completeness of the contents of this work and specifically disclaim all warranties, including without limitation any implied warranties of merchantability or fitness for a particular purpose. No warranty may be created or extended by sales representatives, written sales materials or promotional statements for this work. The fact that an organization, website, or product is referred to in this work as a citation and/or potential source of further information does not mean that the publisher and authors endorse the information or services the organization, website, or product may provide or recommendations it may make. This work is sold with the understanding that the publisher is not engaged in rendering professional services. The advice and strategies contained herein may not be suitable for your situation. You should consult with a specialist where appropriate. Further, readers should be aware that websites listed in this work may have changed or disappeared between when this work was written and when it is read. Neither the publisher nor authors shall be liable for any loss of profit or any other commercial damages, including but not limited to special, incidental, consequential, or other damages.

Library of Congress CataloginginPublication Data

Names: Blackledge, Robert D., editor.

Title: Leading edge techniques in forensic trace evidence analysis : more

new trace analysis methods / edited by Robert D. Blackledge.

Description: First edition. | Hoboken, NJ : Wiley, 2023.

Identifiers: LCCN 2022025481 (print) | LCCN 2022025482 (ebook) | ISBN

9781119591610 (cloth) | ISBN 9781119591832 (adobe pdf) | ISBN

9781119591801 (epub)

Subjects: LCSH: Trace evidenceAnalysis.

Classification: LCC HV8073 .L33495 2023 (print) | LCC HV8073 (ebook) |

DDC 363.25/6dc23/eng/20220714

LC record available at https://lccn.loc.gov/2022025481

LC ebook record available at https://lccn.loc.gov/2022025482

Cover Design: Wiley

Cover Images: Cover and interior images courtesy of West Technology Systems Limited

List of Contributors
  • Jocelyn V. Abonamah
  • Visiting Scientist Program
  • Research and Support Unit
  • Federal Bureau of Investigation Laboratory Division
  • Quantico, VA
  • USA
  • Christoffer K. Abrahamsson
  • Department of Chemistry and Chemical Biology
  • Harvard University
  • Cambridge, MA
  • USA
  • Alina Astefanei
  • Van't Hoff Institute for Molecular Sciences
  • Faculty of Science, Analytical Chemistry Group
  • University of Amsterdam
  • Amsterdam, The Netherlands
  • Arian van Asten
  • Van't Hoff Institute for Molecular Sciences
  • University of Amsterdam
  • 1090 GD Amsterdam
  • The Netherlands

    and

  • Co van Ledden Hulsebosch Center (CLHC)
  • Amsterdam Center for Forensic Science and Medicine
  • University of Amsterdam, Van't Hoff Institute for Molecular Sciences
  • 1090 GD Amsterdam
  • The Netherlands
  • Graceson Aufderheide
  • Molecular Vista, Inc.
  • San Jose, CA
  • USA
  • Jeffrey G. Bell
  • Department of Chemistry and Chemical Biology
  • Harvard University
  • Cambridge, MA
  • USA
  • Charles A. Bishop
  • CA Bishop Consulting Ltd.
  • Consultant on Vacuum Deposition Technology
  • Leicestershire
  • UK
  • Robert D. Blackledge
  • Retired, formerly Senior Chemist
  • Naval Criminal Investigative Service
  • Regional Forensic Laboratory
  • San Diego, CA
  • USA

    and

  • 8365 Sunview Drive
  • El Cajon, CA 92021
  • USA
  • Candice Bridge
  • National Center for Forensic Science and the Department of Chemistry
  • University of Central Florida
  • College of Sciences
  • Orlando, FL
  • USA
  • Christopher Deeks
  • Channel Manager EMEA Surface Analysis at Thermo Fisher Scientific
  • Joris Dik
  • Materials Science and Engineering
  • Delft University of Technology
  • 2600 AA Delft
  • The Netherlands
  • Joseph Donfack
  • Research and Support Unit
  • Federal Bureau of Investigation Laboratory Division
  • Quantico, VA 22135
  • USA
  • Brian A. Eckenrode
  • Research and Support Unit
  • Federal Bureau of Investigation Laboratory Division
  • Quantico, VA 22135
  • USA
  • Shencheng Ge
  • Department of Chemistry and Chemical Biology
  • Harvard University
  • Cambridge, MA
  • USA
  • Alwin Knijnenberg
  • Netherlands Forensic Institute
  • 2490 AA The Hague
  • The Netherlands
  • Maria Lawas
  • Visiting Scientist Program
  • Research and Support Unit
  • Federal Bureau of Investigation Laboratory Division
  • Quantico, VA
  • USA
  • Annelies van Loon
  • Rijksmuseum
  • 1070 DN Amsterdam
  • The Netherlands
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