Intelligent
Reliability
Analysis Using
MATLAB and AI
Perform Failure Analysis and
Reliability Engineering using
MATLAB and Artificial Intelligence
Dr. Cherry Bhargava
Dr. Pardeep Kumar Sharma
www.bpbonline.com
FIRST EDITION 2021
Copyright BPB Publications, India
ISBN: 978-93-90684-656
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Dedicated to
Our Parents
&
Our Loving Daughters, Mishty & Mauli
About the Authors
Dr. Cherry Bhargava is working as an Associate Professor at the Department of Computer Science and Engineering, Symbiosis Institute of Technology, Pune, Maharashtra, India. She has more than years of teaching and research experience. She has a PhD (ECE) from the IKG Punjab Technical University, State Govt. University, Punjab, an M. Tech (VLSI Design & CAD) from Thapar University, and a B. Tech (EIE) from Kurukshetra University. She is a GATE-qualified with an All-India Rank of She has authored about fifty technical research papers in SCI, Scopus indexed quality journals, and national/international conferences. She has eighteen books to her credit. She has registered six copyrights and filed twenty-one patents. Her four Australian innovation patents are granted. She is a recipient of various national and international awards for being an outstanding faculty in engineering and an excellent researcher. She is an active reviewer and editorial member of numerous prominent SCI and Scopus indexed journals. Her research area is Nanotechnology, Artificial Intelligence, and Data Science.
Dr. Pardeep Kumar Sharma is working as an Associate Professor at the Lovely Professional University, Punjab, India. He has more than years of teaching experience in the field of Applied Chemistry, Artificial Intelligence, DOE, and Nanotechnology. He has a PhD from the Lovely Professional University, and a post-graduation degree (Applied Chemistry) from the Guru Nanak Dev University, Amritsar. He has authored more than twenty research papers in SCI, Scopus indexed quality journals, and national/international conferences. He has seven books to his credit, in the field of Nanotechnology and Artificial Intelligence. He has filed eighteen patents and registered two copyrights. His four Australian innovation patents are granted. He is a recipient of various national and international awards. He is an active reviewer and editorial board member of various indexed journals.
About the Reviewers
Deepak Kutty is a Reliability professional with nearly years of experience in quality and reliability engineering across several industries. He has worked in different aspects of reliability, such as testing and analysis, field failure analysis, reliability growth, and DFR and analytics. He has a Masters degree in quality and reliability from the Indian Statistical Institute, Kolkata, and a Bachelors degree in Mechanical Engineering from the Mumbai University. He currently works as a senior staff engineer in bloom energy in their Data Analytics department.
N. Chaitanya Kumar Reddy, currently employed as a Reliability and Safety Engineer in AMETEK Instruments India Limited, has 10+ years of work experience in the area of Reliability and Safety for the Industrial Products related to Aerospace, Electronics etc. He completed his Master of Technology in Reliability Engineering in 2012 as a Gold Medalist of the batch, and the Bachelor of Technology in Electrical and Electronics Engineering in 2010 from JNT University. His interests include Scientific Research, and he has published papers in a number of reputed journals.
Acknowledgement
At this moment of my substantial enhancement, before we get into the thick of the things, we would like to add a few heartfelt words for the people who gave their unending support with their fair humor and warm wishes. First and foremost, praises and thanks to the God, the Almighty, for his showers of blessings throughout, to complete this book successfully. We want to acknowledge our students who provided us with the impetus to write a more suitable text. We are thankful to the management, seniors, and colleagues of Symbiosis International University and Lovely Professional University for constantly pushing us to move higher and higher. We would also like to thank all our friends, well-wishers, respondents, and academicians who us helped throughout our journey from inception to completion.
Preface
Due to the rapid evolution of the electronics device technology towards low cost and high performance, the electronic products become more complex, higher in density and speed, and lighter for easy portability. Reliability has become the major issue for the successful operation of an electronic device. During the life cycle of a component, reliability needs to be accessed at its different stages of life, i.e., at the design stage, manufacturing stage, launching stage, and operational stage. So, the assessing of the component performance at the different phases are necessary. After analyzing all the factors and parameters, the warranty period is extracted, which is mentioned along with the data sheet. The failure analysis explores the root cause of failure and then suggests the preventive and corrective measures, so that the overall performance of the system will not degrade.