Mark A. Richards - Principles of Modern Radar: Basic Principles

Contents

James A. Scheer and William A. Holm

James A. Scheer and Melvin L. Belcher Jr.

Jeffrey A. Bean, Kenneth W. Allen and Jay A. Saffold

Mark A. Richards and William A. Holm

K. James Sangston and Nicholas C. Currie

John Shaeffer

Mark A. Richards

Mark A. Richards

Philip M. Brady and Christopher D. Bailey

J.C. Hurst, H.M. Harris, J.W. Kemp, J.A. Lightner and B.K. Wagner

Alexander J. Trzecieski

Alexander J. Trzecieski

Roger Dickerson, David Oostdyk and Mark A. Richards

Mark A. Richards

Byron Murray Keel

Mark A. Richards

Mark A. Richards and William L. Melvin

Samuel Shapero

Byron Murray Keel

Gregory A. Showman

Principles of Modern Radar

Vol. I: Basic Principles

Second Edition

Mark A. Richards

William L. Melvin

The Institution of Engineering and Technology

Publisher Acknowledgements

The Editors

It's a big ask to edit a major textbook, let alone 3 volumes. The publishers would like to thank Mark and Bill for giving up much of their free time over the past 18 months to lead on this book. We now get to do it all again for Volumes 2 and 3!

Technical Reviewers

IET publishing would like to gratefully acknowledge the help of the following reviewers who helped by either pre-reviewing chapters and suggesting areas for improvement, or by reviewing the draft and then final chapters as they were written, or both! It seems it takes a Radar Village to raise and maintain a book such as this!

Clive Alabaster, Cranfield University, UK

Chris Thomas Allen, University of Kansas

Moeness G. Amin, Villanova University

Augusto Aubry, University of Naples, Italy

Jamie Bergin, Information System Laboratories, US

Jennifer Bernhard, University of Illinois Urbana-Champaign

Dan Bliss, Arizona State University

Shannon Blunt, University of Kansas

Paolo Braca, Centre for Maritime Research and Experimentation, NATO, Italy

Mike Brinkmann, Georgia Institute of Technology

Mervin Budge, Dynetics Inc. US

C. Y. Chang, Raytheon

Gregory Charvat, visiting research scientist at MIT Media Lab

Victor Chen, Ancortek Inc. US

Mark E. Davis, MEDavis Consulting & AESS President

Mike Davis, Georgia Institute of Technology

Antonio De Maio, University of Naples, Italy

Armin Doerry, Sandia National Labs, US

Warren Du Plessis, University of Pretoria, South Africa

Alfonso Farina, Technical Consultant, Italy

Caleb Fulton, University of Oklahoma

Eric Gill, Memorial University, Canada

Maria Greco, University of Pisa, Italy

Marshall Greenspan, Northrop Grumman Corp. retired

Hugh Griffiths, University College London, UK

Joe Guerci, Information System Laboratories, US

Sevgi Gurbuz, University of Alabama

Jeffrey Herd, MIT Lincoln Labs

Braham Himed, Air Force Research Lab

Reed Irion, MIT Lincoln Labs

Gerhard Krieger, German Aerospace Center (DLR)

Nadav Levanon, Tel Aviv University, Israel

Hongbin Li, Stevens Institute of Technology

David Long, Brigham Young University

Marco Martorella, University of Pisa, Italy

Ram Narayanan, Penn State University

Willie Nel, Council for Scientific and Industrial Research, South Africa

Danilo Orlando, Universit degli Studi Niccol Cusano, Italy

Audrey Paulus, Georgia Institute of Technology

Nils Pohl, Fraunhofer Institute, Germany

Murali Rangaswarmy, Air Force Research Lab

Jens Reimann, German Aerospace Center (DLR)

Ricardo Rico, Raytheon

Luke Rosenberg, Defence Science and Technology Group, Australia

Daniel Sjoberg, Lund Institute of Technology, Sweden

Clayton Stewart, Clayton Stewart Consulting, UK

Fawwaz Ulaby, University of Michigan

Mike Underhill, Underhill Research Limited, UK

Keith Ward, Igence Ltd, UK

Simon Watts, Thales (retired)

Graham Weinberg, Defence Science and Technology Group, Australia

John Wilcher, Georgia Institute of Technology

Mark Yeary, University of Oklahoma

If you would like to help with the next two volumes, then please email the publishers at nickidennis@theiet.org

List of Acronyms

The following acronyms are used in this text. A few, for example ROM and LSB, have multiple meanings; the intended meaning is generally clear form context.