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Jacques I. Pankove - Optical Processes in Semiconductors

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Jacques I. Pankove Optical Processes in Semiconductors
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    Optical Processes in Semiconductors
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This comprehensive textbook and reference covers all phenomena involving light in semiconductors, emphasizing modern applications in semiconductor lasers, electroluminescence, photodetectors, photoconductors, photoemitters, polarization effects, absorption spectroscopy, radiative transfers and reflectance modulatons. With numerous problems. 339 illustrations.

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Table of Contents APPENDIX I TABLE OF SYMBOLS II PROPERTIES OF - photo 1
Table of Contents

APPENDIX

I TABLE OF SYMBOLS
II PROPERTIES OF SEMICONDUCTORS
III NOMOGRAPH OF THE TEMPERATURE DEPENDENCE OF THE FERMI LEVEL IN A DEGENERATE PARABOLIC BAND
IV PHYSICAL CONSTANTS

TABLE OF SYMBOLS
I
aLattice constant; Bohr orbit
cVelocity of light in vacuum
DDiffusion coefficient
EEnergy
E c , E vEnergies of conduction- and valence-band edges
E gGap energy
E lIonization energy; energy of initial state
E A , E D , E xBinding energies of acceptor, donor, and exciton
E FFermi level
E fEnergy of final state
E Fn , E FpQuasi-Fermi levels for electrons and for holes
E oEnergy needed to create an electron-hole pair
E pPhonon energy
E pEnergy of primary electron
E TThreshold for photoelectric emission
E tEnergy of trapping level
Electric field
FForce
fFermi function
gGain
GGeneration rate
hPlancks constant
Diracs constant
i, ICurrent
I oSaturation current
I scShort circuit current
j, JCurrent density
kBoltzmanns constant; wave vector; momentum vector
kExtinction coefficient
KMomentum vector
/Length
LLight intensity
L,Diffusion length for electrons
L hDiffusion length for holes
mMass of free electron
Effective mass of electron
Effective mass of hole
n cComplex index of refraction
nReal part of index of refraction
nElectron concentration
NConcentration
N c , NDensities of states in conduction and valence bands
N A , N a ; N D , N dConcentrations of acceptors and donors
N iConcentration of impurities
N pPhonon density
N T , N tConcentration of traps
PProbability, pressure, power
qElectron charge
QTotal charge
rRadius
RReflection coefficient; recombination rate; resistance
tTime
TTemperature, transmission
Velocity
VVoltage, volume
V DDember voltage
V ocOpen circuit voltage
Absorption coefficient
Dielectric constant
Work function
B, bBarrier height
Efficiency
KSpecific heat
Mobility
vFrequency
Angular frequency
pResistivity; density of states
Conductivity; capture cross-section
Time constant
Angle
Susceptibility; electron affinity
Energy of the Fermi level with respect to band edge
PROPERTIES OF SEMICONDUCTORS 1
II
NOMOGRAPH OF THE TEMPERATURE DEPENDENCE OF THE FERMI LEVEL IN A DEGENERATE - photo 2
NOMOGRAPH OF THE TEMPERATURE DEPENDENCE OF THE FERMI LEVEL IN A DEGENERATE - photo 3
NOMOGRAPH OF THE TEMPERATURE DEPENDENCE OF THE FERMI LEVEL IN A DEGENERATE PARABOLIC BAND
III

In a simple parabolic band characterized by an effective mass m* containing a concentration of n carriers/cm3 at any temperature, the position of the Fermi level with respect to the band edge is related to the temperature T by the expression

III-1 where E is the carriers energy E and both being measured with - photo 4

(III-1)

where E is the carriers energy, E and both being measured with respect to the bottom of the parabolic band; k and h are Boltzmanns and Plancks constants, respectively. Equation (III-1) was solved by computer for various values of n, m*, and T. For this purpose, Eq. (III-1) was expressed in the intermediate form

Optical Processes in Semiconductors - image 5

where

Optical Processes in Semiconductors - image 6

The nomograph() permits a graphical determination of any parameter n, m*, , or T when any three of them are known. For example. if n and m* are known, they are joined by a straight line. From the intercept of this straight line with the X - axis one draws a straight line to the desired T tc find a value on the left-hand - scale. Transferring this value to the right-hand - scale, one strikes another straight line to T to find . If is negative, lies outside the parabolic band (i.e., inside the energy gap).

Optical Processes in Semiconductors - image 7

By way of example, the diagram illustrates how one finds the position of the Fermi level at T = 80K in n- type GaAs Optical Processes in Semiconductors - image 8 having a carrier concentration n = 1 1017 cm-3. The three steps labeled 1, 2, 3, lead to 3 meV.

Of course, this nomograph is valid only for the case of a temperature-independent free-carrier density and, therefore, it does not apply in the temperature range where carrier freeze-out may occur. Furthermore, a gross approximation is made by assuming that the band is parabolic over the entire range of energies over which the distribution function is appreciable. The neglect of band tailing and of nonpara-bolicity makes the value determined by this nomograph a maximum value.

PHYSICAL CONSTANTS
IV
Electron chargeq= 4.8 10-10 esu = 1.602 10-19 coulomb
Mass of free electronm= 9.11 10-28 g
Velocity of light in vacuumc= 2.998 1010 cm/sec
Bohr radiusa 0= 5.29 10-9 cm
Plancks constanth= 6.62 10-27 erg sec = 4.5 10-15 eVsec
Diracs constanth= 1.054 10-27 ergs sec
Boltzmanns constantk= 1.380 10-16 erg/K = 8.62 10-5 eV/
Thermal energykT= 25.9 meV at room temperature
= 6.7 meV at liquid-nitrogen temperature
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