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Banqiu Wu - 3D IC Stacking Technology

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Banqiu Wu 3D IC Stacking Technology

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The latest advances in three-dimensional integrated circuit stacking technology

With a focus on industrial applications, 3D IC Stacking Technology offers comprehensive coverage of design, test, and fabrication processing methods for three-dimensional device integration. Each chapter in this authoritative guide is written by industry experts and details a separate fabrication step. Future industry applications and cutting-edge design potential are also discussed. This is an essential resource for semiconductor engineers and portable device designers.

3D IC Stacking Technology covers:

  • High density through silicon stacking (TSS) technology
    • Practical design ecosystem for heterogeneous 3D IC products
    • Design automation and TCAD tool solutions for through silicon via (TSV)-based 3D IC stack
    • Process integration for TSV manufacturing
    • High-aspect-ratio silicon etch for TSV
    • Dielectric deposition for TSV
    • Barrier and seed deposition
    • Copper...
  • Banqiu Wu: author's other books


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    3D IC Stacking
    Technology

    Banqiu Wu PhD is Chief Technology Officer TSV and Mask Products Business - photo 1

    Banqiu Wu, PhD, is Chief Technology Officer, TSV and Mask Products Business Group, Applied Materials, Inc. He has published more than 50 technological papers in 10 peer-reviewed journals and conference proceedings, and authored or co-authored several books, including Photomask Fabrication Technology and Extreme Ultraviolet Lithography, both published by McGraw-Hill. Dr. Wu holds multiple patents and awards.

    Ajay Kumar PhD MBA is Vice President and General Manager TSV and Mask - photo 2

    Ajay Kumar, PhD, MBA, is Vice President and General Manager, TSV and Mask Products Business Group, Applied Materials, Inc. He has more than 75 publications to his credit in various journals, including several review articles. Dr. Kumar co-authored Extreme Ultraviolet Lithography, published by McGraw-Hill. He holds more than 100 U.S. patents and has won many awards for innovation and commercialization.

    Sesh Ramaswami is a Senior Director of TSV strategy and marketing at Applied - photo 3

    Sesh Ramaswami is a Senior Director of TSV strategy and marketing at Applied Materials, Inc. His responsibilities include TSV and associated wafer-level processing for packaging. Mr. Ramaswami holds 35 U.S. patents, has authored more than 40 conference publications, and made presentations at conferences such as MRS, ECS, VMIC, AVS, SPIE, and IRPS.

    3D IC Stacking
    Technology

    Banqiu Wu

    Ajay Kumar

    Sesh Ramaswami

    3D IC Stacking Technology - image 4

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    Copyright 2011 by The McGraw-Hill Companies Inc All rights reserved Except - photo 5

    Copyright 2011 by The McGraw-Hill Companies, Inc. All rights reserved. Except as permitted under the United States Copyright Act of 1976, no part of this publication may be reproduced or distributed in any form or by any means, or stored in a database or retrieval system, without the prior written permission of the publisher.

    ISBN 978-0-07-174196-5
    MHID 0-07-174196-8

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    Contents

    1 Introduction to High-Density Through Silicon
    Stacking Technology
    Matthew Nowak

    1.3.2 Examples of Architectural Uniqueness
    from Through Silicon Stacking

    2 A Practical Design Eco-System for Heterogeneous
    3D IC Products
    Riko Radojcic

    2.1.2 Causes for Incremental Design
    Specification Instability in 3D

    3 Design Automation and TCAD Tool Solutions
    for Through Silicon ViaBased 3D IC Stack

    Jamil Kawa and Xiaopeng Xu

    4 Process Integration for TSV Manufacturing
    Sesh Ramaswami

    5 High-Aspect-Ratio Silicon Etch for TSV
    Banqiu Wu and Ajay Kumar

    6 Dielectric Deposition for Through Silicon Vias
    Heung Lak Park, Ran Ding, and Kedar Sapre

    7 Barrier and Seed DepositionJohn Forster and
    Praburam Gopalraja

    8 Copper Electrodeposition for TSV
    Rozalia Beica

    9 Chemical Mechanical Polishing for TSV
    Applications
    Yuchun Wang, Max Gage,
    Wen-Chiang Tu, and Lakshmanan Karuppiah

    10 Temporary and Permanent BondingBioh Kim,
    Matthias Thorsten, Dragoi Viorel,
    Markus Wimplinger, and Paul Lindner

    11 Assembly and Test Aspects of TSV Technology
    Robert Darveaux, Rick Reed, Ki Wook Lee, Mark Berry,
    Ron Huemoeller, Seong Min Seo, Jesse Galloway,
    Nozad Karim, Jae Dong Kim, and
    Choon Heung Lee

    Contributors

    Rozalia BeicaApplied Materials, Inc., Santa Clara, California ( CHAP . 8)

    Mark BerryAmkor Technology, Inc., Chandler, Arizona ( CHAP . 11)

    Robert DarveauxAmkor Technology, Inc., Chandler, Arizona ( CHAP . 11)

    Ran DingApplied Materials, Inc., Sunnyvale, California ( CHAP . 6)

    John ForsterApplied Materials, Inc., Sunnyvale, California ( CHAP . 7)

    Max GageApplied Materials, Inc., Sunnyvale, California ( CHAP . 9)

    Jesse GallowayAmkor Technology, Inc., Chandler, Arizona ( CHAP . 11)

    Praburam GopalrajaApplied Materials, Inc., Sunnyvale, California ( CHAP . 7)

    Ron HuemoellerAmkor Technology, Inc., Chandler, Arizona ( CHAP . 11)

    Nozad Karim

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