3D IC Stacking
Technology
Banqiu Wu, PhD, is Chief Technology Officer, TSV and Mask Products Business Group, Applied Materials, Inc. He has published more than 50 technological papers in 10 peer-reviewed journals and conference proceedings, and authored or co-authored several books, including Photomask Fabrication Technology and Extreme Ultraviolet Lithography, both published by McGraw-Hill. Dr. Wu holds multiple patents and awards. |
Ajay Kumar, PhD, MBA, is Vice President and General Manager, TSV and Mask Products Business Group, Applied Materials, Inc. He has more than 75 publications to his credit in various journals, including several review articles. Dr. Kumar co-authored Extreme Ultraviolet Lithography, published by McGraw-Hill. He holds more than 100 U.S. patents and has won many awards for innovation and commercialization. |
Sesh Ramaswami is a Senior Director of TSV strategy and marketing at Applied Materials, Inc. His responsibilities include TSV and associated wafer-level processing for packaging. Mr. Ramaswami holds 35 U.S. patents, has authored more than 40 conference publications, and made presentations at conferences such as MRS, ECS, VMIC, AVS, SPIE, and IRPS. |
3D IC Stacking
Technology
Banqiu Wu
Ajay Kumar
Sesh Ramaswami
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Contents
1 Introduction to High-Density Through Silicon
Stacking TechnologyMatthew Nowak
1.3.2 Examples of Architectural Uniqueness
from Through Silicon Stacking
2 A Practical Design Eco-System for Heterogeneous
3D IC ProductsRiko Radojcic
2.1.2 Causes for Incremental Design
Specification Instability in 3D
3 Design Automation and TCAD Tool Solutions
for Through Silicon ViaBased 3D IC Stack
Jamil Kawa and Xiaopeng Xu
4 Process Integration for TSV Manufacturing
Sesh Ramaswami
5 High-Aspect-Ratio Silicon Etch for TSV
Banqiu Wu and Ajay Kumar
6 Dielectric Deposition for Through Silicon Vias
Heung Lak Park, Ran Ding, and Kedar Sapre
7 Barrier and Seed DepositionJohn Forster and
Praburam Gopalraja
8 Copper Electrodeposition for TSV
Rozalia Beica
9 Chemical Mechanical Polishing for TSV
ApplicationsYuchun Wang, Max Gage,
Wen-Chiang Tu, and Lakshmanan Karuppiah
10 Temporary and Permanent BondingBioh Kim,
Matthias Thorsten, Dragoi Viorel,
Markus Wimplinger, and Paul Lindner
11 Assembly and Test Aspects of TSV Technology
Robert Darveaux, Rick Reed, Ki Wook Lee, Mark Berry,
Ron Huemoeller, Seong Min Seo, Jesse Galloway,
Nozad Karim, Jae Dong Kim, and
Choon Heung Lee
Contributors
Rozalia BeicaApplied Materials, Inc., Santa Clara, California ( CHAP . 8)
Mark BerryAmkor Technology, Inc., Chandler, Arizona ( CHAP . 11)
Robert DarveauxAmkor Technology, Inc., Chandler, Arizona ( CHAP . 11)
Ran DingApplied Materials, Inc., Sunnyvale, California ( CHAP . 6)
John ForsterApplied Materials, Inc., Sunnyvale, California ( CHAP . 7)
Max GageApplied Materials, Inc., Sunnyvale, California ( CHAP . 9)
Jesse GallowayAmkor Technology, Inc., Chandler, Arizona ( CHAP . 11)
Praburam GopalrajaApplied Materials, Inc., Sunnyvale, California ( CHAP . 7)
Ron HuemoellerAmkor Technology, Inc., Chandler, Arizona ( CHAP . 11)
Nozad Karim
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